BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Marketing EDA - ECPv6.17.1//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://marketingeda.com
X-WR-CALDESC:Events for Marketing EDA
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:Asia/Kolkata
BEGIN:STANDARD
TZOFFSETFROM:+0530
TZOFFSETTO:+0530
TZNAME:IST
DTSTART:20230101T000000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=Asia/Kolkata:20241217T080000
DTEND;TZID=Asia/Kolkata:20241220T170000
DTSTAMP:20241122T213230Z
CREATED:20241122T213230Z
LAST-MODIFIED:20241122T213230Z
UID:8530-1734422400-1734714000@marketingeda.com
SUMMARY:IEEE Asian Test Symposium 2024
DESCRIPTION:The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the world\, not just from Asia\, to present and discuss various aspects of system\, board and device testing with design\, manufacturing and field considerations in mind. \nThe 33th IEEE Asian Test Symposium (ATS 2024)\nDecember 17-20\, 2024\, Ahmedabad\, Gujarat\, India \n  \n\nThe Asian Test Symposium started 1992 in Hiroshima\, Japan\, as an annual symposium in the Asia Pacific region. Since then\, the symposium has continued its growth and development\, visiting various historic cities in Asia. This year it is marking its 33rd anniversary to Ahmedabad\, India. We welcome all the contributors to the heritage city of India.\n\n\nThe walled city of Ahmadabad was founded by Sultan Ahmad Shah in 1411 AD on the eastern bank of the Sabarmati River. On July 8th\, 2017\, a remarkable moment unfolded as Ahmedabad earned the title of India’s first-ever UNESCO World Heritage City.\n\n\nScope\n\n\n\nThe Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world\, especially from Asia\, to present and discuss various aspects of device\, board and system testing with design\, manufacturing and field considerations in mind. \n\n\n\n\nMajor topics including\, but not limited to: \n\n\n\n\n\n\n\n\n\nAutomatic Test Pattern Generation (ATPG)\nAnalog Test / Mixed-Signal Test\nBoundary Scan Test\nBoard and System Test\nBuilt-In Self-Test\nDesign for Testability (DFT)\nDesign Verification and Validation\nDefect-Based Testing\nDelay and Performance Test\nDiagnosis and Debug\nDependable System\nEconomics of Test\n\n\n\n\n\n\n\n\n\n\nFault Modeling and Simulation\nFault Tolerance\nHigh-Speed I/O Test / RF Testing\nMemory Test / FPGA Test\nOn-Line Test\nSystem-on-a-Chip Test\nSystem-in-package (SiP) / 3D Test\nSoftware Testing / Software Design for Testing\nTest Compression\nTemperature / Power-aware Test\nTest Quality\nYield Analysis and Enhancement\n\n\n\n\n\n\n\nShare this:\n				Share on LinkedIn (Opens in new window)\n				LinkedIn\n			\n				Share on X (Opens in new window)\n				X\n			\n				Share on Facebook (Opens in new window)\n				Facebook\n			Like this:Like Loading…
URL:https://marketingeda.com/event/ieee-asian-test-symposium-2024/
LOCATION:Courtyard by Marriott\, Ahmedabad\, Sindhu Bhawan Roa\, Ahmedabad\, India
CATEGORIES:EDA,Symposium
ATTACH;FMTTYPE=image/jpeg:https://marketingeda.com/wp-content/uploads/ATS-2024.jpg
END:VEVENT
END:VCALENDAR