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ChipEx 2022

Expo Tel Aviv Tel Aviv, Israel

ChipEx2022 The main event of the Israeli semiconductor industry, will be held on May 10, 2022 at the Expo Tel Aviv Conference Center. The event is expected to attract thousands of industry professionals including engineers, development managers, project managers, professional experts, procurement managers and more. ChipEx2022 will include lectures by the best experts from around the world who will deal… Read More »ChipEx 2022

European Test Symposium 2022

Casa Convalescencia Barcelona, Spain

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation. ETS’22 will be held in Casa Convalescència, located in the historical modernist site Hospital de la Santa… Read More »European Test Symposium 2022

International Test Conference 2023

Disneyland Hotel 1150 West Magic Way, Anaheim, CA, United States

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how… Read More »International Test Conference 2023

42nd VLSI Test Symposium

Memorial Union Conference Center 1151 S Forest Ave, Tempe, AZ, United States

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems. The symposium will take place on April 22-24 2024, in Tempe, AZ, USA. The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.… Read More »42nd VLSI Test Symposium