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Optimize Test QoR & TTM with AI-Driven Technology

Continuously increasing semiconductor design sizes and complexity have resulted in increased test costs. Today’s competitive environment and critical market windows are pushing companies to adopt aggressive design schedules. The traditional method of manual iterations and fine-tuning test configurations to optimize test quality-of-results (QoR) is highly unpredictable and inefficient. Engineers can no longer rely on such… Optimize Test QoR & TTM with AI-Driven Technology