In the era of more-than-Moore’s law, chip makers are scaling by adopting complex architectures that connect dies vertically (3D IC) or side-by-side (2.5D). There has been progress throughout the semiconductor ecosystem in bringing 2.5D and 3D ICs designs to the mainstream, including design-for-test (DFT). If you are an engineer, DFT manager, CAD director or someone… Read More »Implementing DFT in 2.5/3D designs using Tessent Multi-die software