IEEE 1838
Implementing DFT in 2.5/3D designs using Tessent Multi-die software
In the era of more-than-Moore’s law, chip makers are scaling by adopting complex architectures that connect dies vertically (3D IC) or side-by-side (2.5D). There has been progress throughout the semiconductor ecosystem in bringing 2.5D and 3D ICs designs to the mainstream, including design-for-test (DFT). If you are an engineer, DFT manager, CAD director or someone… Read More »Implementing DFT in 2.5/3D designs using Tessent Multi-die software
DFT for chiplets & 3D ICs using Tessent Multi-die
3D IC (2.5D/3D) designs are on the rise. Design for Test (DFT) for chiplets must be general purpose so they can be tested stand alone and easy to test after assembly into 2.5D or 3D devices. In this webinar you will learn how to use Tessent Multi-die and still adhere to standards like IEEE 1149.1,… Read More »DFT for chiplets & 3D ICs using Tessent Multi-die