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Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices During SiC device switching operations, it is possible that devices could be reaching abnormal overload conditions, which is why some applications require “robustness” specifications (e.g., Short Circuit and UIS… Read More »Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices