40th IEEE VLSI Test Symposium 2022

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in the test, validation, yield, reliability, and security of microelectronic circuits and systems.

Due to the COVID-19 worldwide situation, the 2022 edition of VTS will be a fully virtual interactive live event.

Update: We offer an option for attendees to attend the first day of the symposium (April 25) in-person at Synopsys site in Northern California (details to come soon)

The symposium will take place on April 25-27, 2022.

The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.

News for authors: VTS review process is DOUBLE BLIND with REBUTTAL, for both scientific papers and industrial application short papers. The references do not count towards the page limit.