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40th IEEE VLSI Test Symposium 2022
April 25, 2022 @ 8:00 am - April 27, 2022 @ 5:00 pm PDT
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in the test, validation, yield, reliability, and security of microelectronic circuits and systems.
Due to the COVID-19 worldwide situation, the 2022 edition of VTS will be a fully virtual interactive live event.
Update: We offer an option for attendees to attend the first day of the symposium (April 25) in-person at Synopsys site in Northern California (details to come soon)
The symposium will take place on April 25-27, 2022.
The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
News for authors: VTS review process is DOUBLE BLIND with REBUTTAL, for both scientific papers and industrial application short papers. The references do not count towards the page limit.