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STMIcroelectronics
Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices During SiC device switching… Read More »Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices