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MDTS 2023

The 32nd Microelectronics Design and Test Symposium (MDTS 2023)

Theme Artificial Intelligence, Machine Learning, and Deep Learning: Tactical and Strategic Impacts to Microelectronics Design and Test About MDTS 2023 The IEEE Microelectronics Design & Test Symposium (MDTS) provides a forum for academic and industry… The 32nd Microelectronics Design and Test Symposium (MDTS 2023)

Advantest VOICE 2023

Advantest VOICE

VOICE is a developer conference, created by test engineers for test engineers. Each year, the VOICE Developer Conference unites semiconductor test professionals representing the world’s leading integrated device manufacturers (IDMs), foundries, fabless semiconductor companies and… Advantest VOICE

proteanTecs, March 7, 2023

THE DATA REVOLUTION OF SEMICONDUCTOR PRODUCTION

The demand for efficient and scalable chip production has never been greater. The need to scale at volume and adapt to shorter innovation cycles makes machine learning and advanced data analytics essential components of semiconductor… THE DATA REVOLUTION OF SEMICONDUCTOR PRODUCTION

MWC 2023

Mobile World Conference, MWC 2023

MWC Barcelona is the largest and most influential event for the connectivity ecosystem. Whether you’re a global mobile operator, device manufacturer, technology provider, vendor, content owner, or are simply interested in the future of tech,… Mobile World Conference, MWC 2023

Synopsys, September 26, 2022

Synopsys 28th Annual Test & SLM Special Interest Group (SIG) Event

As a member of the design and test community, you are invited to attend Synopsys 28th Annual Test & SLM Special Interest Group (SIG) at the 2022 International Test Conference (ITC). This year’s event will… Synopsys 28th Annual Test & SLM Special Interest Group (SIG) Event

European Test Symposium 2022

European Test Symposium 2022

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability,… European Test Symposium 2022