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iMAPS, March 7-10, 2022

IMAPS Device Packaging

The 18th Annual Device Packaging Conference (DPC 2022) will be held at the WeKoPa Resort and Conference Center, from March 7-10, 2022. It is an international event organized by the International Microelectronics Assembly and Packaging Society (IMAPS). The conference is a… IMAPS Device Packaging

GOMACTech 2022

GOMACTech 2022

WELCOME TO GOMACTech 2022 Enabling Distributed Capabilities: Microelectronics Thriving in the Face of Change GOMACTech was established primarily to review developments in microcircuit applications for government systems. Established in 1968, the conference has focused on… GOMACTech 2022

Merry Christmas 2021

It’s time for my annual Christmas and Holiday greetings from Semiconductor, #SemiEDA and #SemiIP companies. Send me your favorites. Past years: 2020 2019 2018 2017 2016 Happy holidays from all of us at Rambus! pic.twitter.com/ZfzZVgA3V9 — Rambus Inc.… Merry Christmas 2021

rambus siemens

CXL and IDE: Important Considerations of Protecting High Speed Interconnects

In a few short years, CXL (Compute Express Link) has evolved from an idea to a rapidly proliferating low latency interconnect standard being adopted into data centers, high performance computing, and cloud computing. However, as… CXL and IDE: Important Considerations of Protecting High Speed Interconnects

Secure C AV

Effectively Addressing the Challenge of Securing Connected and Autonomous Vehicles

Overview As vehicles get more complex and connected, the attack surface increases. This presents increasing challenges for cybersecurity. This webinar introduces hardware based techniques for addressing security concerns, from legacy through to the future. What… Effectively Addressing the Challenge of Securing Connected and Autonomous Vehicles

ITC 2021

Iternational Test Conferece

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back… Iternational Test Conferece