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STMIcroelectronics

Silvaco, March 28, 2024

Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices

Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC… Read More »Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices

DVClub, November 28, 2023

Auto-generation of Verification Infrastructure for IP to SoC

Agenda (BST): Time Session Description Slides Videos 12.00 GMT Welcome and Introduction Mike Bartley,Tessolve 12.00 GMT Agnisys 12.30 GMT Imperas 12.45 GMT Breker 13.00 GMT… Read More »Auto-generation of Verification Infrastructure for IP to SoC