IEEE Asian Test Symposium 2024
December 17 @ 8:00 am - December 20 @ 5:00 pm UTC+5.5
The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the world, not just from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind.
The 33th IEEE Asian Test Symposium (ATS 2024)
December 17-20, 2024, Ahmedabad, Gujarat, India
The Asian Test Symposium started 1992 in Hiroshima, Japan, as an annual symposium in the Asia Pacific region. Since then, the symposium has continued its growth and development, visiting various historic cities in Asia. This year it is marking its 33rd anniversary to Ahmedabad, India. We welcome all the contributors to the heritage city of India.
The walled city of Ahmadabad was founded by Sultan Ahmad Shah in 1411 AD on the eastern bank of the Sabarmati River. On July 8th, 2017, a remarkable moment unfolded as Ahmedabad earned the title of India’s first-ever UNESCO World Heritage City.
Scope
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
Major topics including, but not limited to:
- Automatic Test Pattern Generation (ATPG)
- Analog Test / Mixed-Signal Test
- Boundary Scan Test
- Board and System Test
- Built-In Self-Test
- Design for Testability (DFT)
- Design Verification and Validation
- Defect-Based Testing
- Delay and Performance Test
- Diagnosis and Debug
- Dependable System
- Economics of Test
- Fault Modeling and Simulation
- Fault Tolerance
- High-Speed I/O Test / RF Testing
- Memory Test / FPGA Test
- On-Line Test
- System-on-a-Chip Test
- System-in-package (SiP) / 3D Test
- Software Testing / Software Design for Testing
- Test Compression
- Temperature / Power-aware Test
- Test Quality
- Yield Analysis and Enhancement