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DFT
DFT for chiplets & 3D ICs using Tessent Multi-die
3D IC (2.5D/3D) designs are on the rise. Design for Test (DFT) for chiplets must be general purpose so they can be tested stand alone and easy to test after… Read More »DFT for chiplets & 3D ICs using Tessent Multi-die
Smart methods for DFT chip architecture & validation
Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling… Read More »Smart methods for DFT chip architecture & validation