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Cadence, May 16, 2024

AI-Driven EM-IR Design Closure

IR drop closure is becoming a major challenge for designers on advanced nodes. The number of violations at signoff has increased significantly, leading to longer turnaround time (TAT) or violations being waived. To solve this… 

Cadence, May 12, 2022

Tackling Advanced Analog FinFET Back-End Design Challenges

The layout implementation of analog circuits in advanced FinFET technologies is becoming increasingly complex and challenging, with many new design rules to consider and multi-patterning, density rules, matching, and EM-IR concerns. These challenges can translate…