AI-Driven EM-IR Design Closure

IR drop closure is becoming a major challenge for designers on advanced nodes. The number of violations at signoff has increased significantly, leading to longer turnaround time (TAT) or violations being waived. To solve this challenge, IR drop needs to be addressed early in the implementation phase with an automated IR prevention and fixing methodology.

In this webinar, we will present an AI-driven EM-IR closure solution integrated into the implementation flow. This solution uses AI methods to automatically root cause the IR drop violations and selects the most efficient PPA- and DRC-aware methods to fix the IR drop issues. The solution also uses AI models to enable fast incremental IR inferencing to validate the benefit of the design improvements.

Come learn about this breakthrough solution that will significantly improve your IR drop closure TAT.