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EM/IR

AI-Driven EM-IR Design Closure

IR drop closure is becoming a major challenge for designers on advanced nodes. The number of violations at signoff has increased significantly, leading to longer turnaround time (TAT) or violations being waived. To solve this challenge, IR drop needs to be addressed early in the implementation phase with an automated IR prevention and fixing methodology.… Read More »AI-Driven EM-IR Design Closure