Webinar
A Novel Reversible Scan Chain Technology that Improves Chain Diagnosis Resolution by 4X
If you can’t make the live session, please register anyway and you’ll get the link to the recorded session afterward. The complicated silicon defect types and defect distribution for advanced technologies can… Read More »A Novel Reversible Scan Chain Technology that Improves Chain Diagnosis Resolution by 4X
Learn About SiCure – Silvaco’s New IR Drop and Thermal Analysis Solution
Learn About SiCure – Silvaco’s New IR Drop and Thermal Analysis Solution Silvaco introduces SiCure, an exciting new development tool for IR-drop and thermal analysis. While being very accurate, SiCure… Read More »Learn About SiCure – Silvaco’s New IR Drop and Thermal Analysis Solution
UVM for FPGAs (Part 3): Verifying Zynq MPSoC Designs?
Learn how UVM Register Access Layer (RAL) can help Presenter: Srinivasan Venkataramanan, Entrepreneur and Head of VerifWorks Thursday, September 23, 2021 Abstract: The use of highly configurable IP-based designs have… Read More »UVM for FPGAs (Part 3): Verifying Zynq MPSoC Designs?