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Applying AI/ML Technology for Rapid Design Optimization
The problem of optimization is a long-standing one in the field of design. For years, the most conventional approach was the brute-force method of running parametric sweeps on the design… Applying AI/ML Technology for Rapid Design Optimization
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Achieve Out-of-the-Box Equivalence Checking with Synopsys Formality ML-driven Distributed Processing
When designers synthesize chip designs with aggressive PPA targets, the expectation and goal is to be able to complete verification with minimal effort and a fast turn-around-time. Synopsys Design Compiler… Achieve Out-of-the-Box Equivalence Checking with Synopsys Formality ML-driven Distributed Processing
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Design and Analysis of Multi-Die & 3D-IC Systems
The architecture and heterogeneous integration capability of 3D-IC (three-dimensional integrated circuits) offer many benefits. The latest configuration methods, CoWoS (Chip On Wafer on Substrate) and WoW (Wafer on Wafer) from… Design and Analysis of Multi-Die & 3D-IC Systems
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Verification Futures 2023 UK
University of Reading Whiteknights Campus Park House, Reading, United KingdomThe Verification Futures conference provides a unique blend of conference presentations, exhibitions, training and industry networking sessions dedicated to discussing the challenges faced in hardware and software verification. Verification Futures… Verification Futures 2023 UK
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DVCon Japan 2023
Kawasaki CIty Industrial Promotion Hall Kawasaki City, JapanThe Design & Verification Conference & Exhibition is the premier conference on the application of languages, tools, methodologies and standards for the design and verification of electronic systems and integrated… DVCon Japan 2023
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How AI and Semiconductors Will Drive Innovation and Productivity
Semiconductors are critical to the functioning of the modern world driving economic competitiveness, national security, and technologies ranging from modern defense capabilities to autonomous vehicles. Artificial Intelligence and the hardware… How AI and Semiconductors Will Drive Innovation and Productivity
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Dealing with Complexity in Formal through Abstraction and Reduction
In the world of formal verification, abstractions along with design reductions, help reduce the state space and make it easier for formal to converge on its proofs. In this webinar… Dealing with Complexity in Formal through Abstraction and Reduction
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European Nanoelectronics Applications Design and Technology Conference
Y-SPOT Building 5, Place Nelson Mandela, Grenoble, FranceFOCUS The European Nanoelectronics Applications, Design & Technology Conference will focus on electronic components, electronic system design, design automation, and manufacturing topics related to micro- and nanoelectronics, which are critical… European Nanoelectronics Applications Design and Technology Conference
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3D & Systems Summit
Dresden Hilton Hotel An der Frauenkirche 5 D, Dresden, GermanyThe SEMI 3D & Systems Summit this year is dedicated to Smarter Systems through Heterogeneous Integration. The semiconductor industry has had several changes in market, products, and tech advancements brought… 3D & Systems Summit
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SFF & SAFE™ Forum 2023 San Jose, CA
Signia by Hilton 170 S Market Street, San Jose, CA, United StatesDay 1 June 27th, 2023 12:00 - 1:00pm PDT Networking Lunch & Registration 1:00 - 1:05pm PDT Opening Jinman Han EVP, Head of DSA Office, Samsung Electronics 1:05 - 1:20pm PDT… SFF & SAFE™ Forum 2023 San Jose, CA
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2023 Andes RISC-V CON
The DoubleTree by Hilton 2050 Gateway Place, San Jose, CA, United StatesRISC-V is revolutionizing the future of Artificial Intelligence (AI) in industries such as automotive, data center, communications, and IoT. Its open-source instruction set architecture (ISA) provides higher performance, lower power,… 2023 Andes RISC-V CON
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Verisium Debug for UPF Low Power Design
Verisium Debug offers comprehensive debugging capabilities. From RTL, UVM testbench to UPF low-power designs, users can use the Cadence unified debugging platform for debugging. In this webinar, users will learn… Verisium Debug for UPF Low Power Design
12 events found.