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Siemens EDA

sept 28, 2021

Formal 101 – Exhaustive Scoreboarding and Data Integrity Verification Made Easy

Verifying the correct passage of data through a DUT in constrained-random simulation is easy to do for basic I/O cases – data loss, obvious corruption,… Read More »Formal 101 – Exhaustive Scoreboarding and Data Integrity Verification Made Easy

Webinar: Reversible Scan Chain Technology Improves Diagnosis Resolution by 4X

A Novel Reversible Scan Chain Technology that Improves Chain Diagnosis Resolution by 4X

If you can’t make the live session, please register anyway and you’ll get the link to the recorded session afterward. The complicated silicon defect types and defect… Read More »A Novel Reversible Scan Chain Technology that Improves Chain Diagnosis Resolution by 4X